| |
|
|
| |
3D
AFM Surf ActiveX control |
| |
3D
AFM Surf ActiveX control provides advanced computer graphics for nanotechnology.
The control allows you to inspect 3-dimensional surfaces in the most
realistic and intuitive way. |
|
| |
The
control is the software development component for scanning microscopy
based application that involves surface measurement and analysis. |
| |
The
AFM Surf ActiveX control
features unique set of 3D measurement tools that provide intuitive
and fast feedback for nanometrology and nanomanipulation. |
| |
The
control is designed for fast application development with ActiveX
aware environment like Visual C++, Visual Basic. |
| |
|
|
| |
Features |
| .
|
|
|
| OpenGL
based, fast real-time render |
| Optimized
compression algorithm for large data sets |
| Fast
animation of the 3D for closer inspection of fine surface structure |
| Interactive
and easy user interface with 3D window |
| Mouse
drag controlled rotation |
| Predefined
and user defined palettes, built in palette construction dialogue |
| Light
control, position and intensity |
| All
sizes zoom |
| Contour
plots |
| Custom
input file formats support |
| Random
Point (XYZ) support: fast Delaunay, triangulator, structured grid
generator |
| Flyby
(upon request) |
| Flexible
output JPG, BMP, AVI |
| |
| |
. |
| |
3D
Measuring Tools |
| |
The
measurement tools are interactive with
mouse operation within 3D window. You can use the tools for easy,
fast and accurate measurement of the geometry of the surface under
inspection. The tools provide events that return all necessary coordinates
of the features of interest. |
|
| Slicers:
orthogonal cut planes |
| 1D
cut: (intersections) read out |
| Volume
tool: semitransparent cube that returns position of the anchors |
| Markers:
multiple markers (pins) |
| Distance
tool: interconnected double pin that returns the XYZ difference of
2 points on the surface |
| Area:
multiple semitransparent
boxes that return range of interest (ROI) coordinates |
|
Report Tool: optional sub-window that shows measurement result |
| Mouse
position tool: you can read mouse position in XYZ space just as you
move mouse over the surface. |
| Multiple
3D labels: selectable color, position, orientation |
| True
3D XYZ axis*, user format or auto formatted |
| Scalable
captions, labels, grids* |
|
|
.
|
|
|
| |
Applications |
| |
|
|
| Atomic
Force Microscopy, AFM |
| Scanning
tunneling microscopy, STM |
| Scanning
probe microscopy, SPM |
| Laser
profiler measurement |
| Dimensional
metrology |
| Surface
metrology |
| Surface
analysis, characterization |
| Nanometrology,
nanotechnology |
| Nanomanipulation |
| Scanning
Near Field Optical microscopy, SNOM, NSOM |
| Interferometry |
| Surface
chemistry |
| .:Generic
and GIS data control:. |
| |
|
|
| |
Implementation |
| |
Available
as executable applications and ActiveX components for VC++, C#, .NET,
VB |
|
| |
Custom
solutions are implemented on VC++, C#, .NET, VB.NET and VB6 programming
platforms |
|
| |
OS:
Windows NT/9x/ME/2000/XP/Vista |
|
| |
|
|
