MS MacroSystem


   3D AFM Surf ActiveX control
  3D AFM Surf ActiveX control provides advanced computer graphics for nanotechnology. The control allows you to inspect 3-dimensional surfaces in the most realistic and intuitive way.
  The control is the software development component for scanning microscopy based application that involves surface measurement and analysis.
  The AFM Surf ActiveX control features unique set of 3D measurement tools that provide intuitive and fast feedback for nanometrology and nanomanipulation.
  The control is designed for fast application development with  ActiveX aware environment like Visual C++, Visual Basic. 
more images   .:Gallery:.
OpenGL based, fast real-time render
Optimized compression algorithm for large data sets
Fast animation of the 3D for closer inspection of fine surface structure
Interactive and easy user interface with 3D window
Mouse drag controlled rotation
Predefined and user defined palettes, built in palette construction dialogue
Light control, position and intensity 
All sizes zoom
Contour plots
Custom input file formats support
Random Point (XYZ) support: fast Delaunay, triangulator, structured grid generator
Flyby (upon request)
Flexible output JPG, BMP, AVI
   3D Measuring Tools
  The measurement tools are interactive with mouse operation within 3D window. You can use the tools for easy, fast and accurate measurement of the geometry of the surface under inspection. The tools provide events that return all necessary coordinates of the features of interest.
Slicers: orthogonal cut planes
1D cut: (intersections) read out
Volume tool: semitransparent cube that returns position of the anchors
Markers: multiple markers (pins)
Distance tool: interconnected double pin that returns the XYZ difference of 2 points on the surface
Area: multiple semitransparent boxes that return range of interest (ROI) coordinates
Report Tool: optional sub-window that shows measurement result 
Mouse position tool: you can read mouse position in XYZ space just as you move mouse over the surface.
Multiple 3D labels: selectable color, position, orientation 
True 3D XYZ axis*, user format or auto formatted
Scalable captions, labels, grids*



Atomic Force Microscopy, AFM
Scanning tunneling microscopy, STM
Scanning probe microscopy, SPM
Laser profiler measurement
Dimensional metrology
Surface metrology
Surface analysis, characterization 
Nanometrology, nanotechnology
Scanning Near Field Optical microscopy, SNOM, NSOM 
Surface chemistry
.:Generic and GIS data control:.
  Available as executable applications and ActiveX components for VC++, C#, .NET, VB    
  Custom solutions are implemented on VC++, C#, .NET, VB.NET and VB6 programming platforms  
  OS: Windows NT/9x/ME/2000/XP/Vista  

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